Software testing is the perfect candidate among software engineering activities for the union of academic and industrial minds. The workshop Testing: Academia-Industry Collaboration, Practice and Research Techniques (TAIC PART) is a unique event that provides a stimulating platform to facilitate collaboration between industry and academia on challenging and exciting problems of real-world software testing. The workshop brings together practitioners and academic researchers in a friendly environment with the goal to transfer knowledge, exchange experiences, and enrich the understanding of the opportunities and challenges in the collaboration between the two sides.

TAIC PART 2017 is the twelfth edition in a series of highly successful events. Take a look at previous events and discover what happened at TAIC PART in the past years by following the links below. This year, TAIC PART will be co-located with the IEEE International Conference on Software Testing, Verification and Validation (ICST 2017) in Tokyo, Japan. Please consider submitting a paper and/or registering to attend TAIC PART so that you can be part of a premier software testing conference.

Sponsor of the TAIC PART 2017 Best Paper Award

TAIC PART 2017 is kindly supported by


Software Competence Center Hagenberg

Important Dates

Workshop date & location:
March 13th, 2017, Tokyo, Japan (at Waseda-University Nishiwaseda Campus)
co-located with ICST 2017 (March 13-18, 2017)

Update: Submission deadline extended to December 8!

Call for Papers

Download the Call for Papers as PDF / Text

Theme and Goals

TAIC PART is a workshop that aims to forge collaboration between industry and academia on the challenging and exciting problem of real-world software testing. It is promoted by representatives of both industry and academia, bringing together industrial software engineers and testers with researchers working on theory and practice of software testing. TAIC PART expects submissions relevant to practice and research like evaluation of testing approaches by means of industrial surveys, case studies or experiments, experience reports on the application of scientific approaches in industry, or ideas on how to facilitate the knowledge transfer between industry and academia.

The goals of TAIC PART range from the articulation of research questions in the field of software testing and analysis to practical challenges faced in industry. The common theme is the discussion and advancement of approaches and methods for sustainable collaboration between academia and industry in software testing.

Topics of Interest

TAIC PART 2017 invites papers on software testing, verification and validation of the following types:

  • Industry experience reports - practical and generalizable insights into how to apply and extend existing approaches to software testing and analysis
  • Research methods for collaborative research - ways that industry and academia can collaborate to further knowledge on testing, verification and validation
  • Industrial challenges with real-world testing - describe a real-world software testing problem for which industry seeks help from academia or vice versa
  • Knowledge exchange between industry and academia - how can new results and knowledge be exchanged between the two partners.

Submission and Proceedings

We invite submissions of the following types:

  • Regular Papers (6 pages): Experience reports, research methods, longer challenge papers (optional up to 10 pages on request)
  • Fast Abstracts (up to 2 pages): Challenges in practice and research, work in progress, positions statements

Regular papers will be evaluated with respect to the real-world significance of the described testing experience as well as their ability to forge partnerships and ultimately yield successful solutions. Fast Abstract papers are short papers that describe late breaking results, works in progress or real-world challenges and will be evaluated according to their ability to generate discussion and suggest interesting areas for future research.

Authors should submit a PDF version of their paper through the TAIC PART 2017 paper submission site: Papers must be written in English and conform to the two-column IEEE template for conference proceedings. All papers will undergo a rigorous review by at least three members of the program committee. All accepted papers will be part of the ICST joint workshop proceedings published in the IEEE Digital Library.

Best Paper Award - Win an iPad!

The best paper presented at TAIC PART 2017 wins an iPad kindly sponsored by Inceptive AB, a Swedish consultancy company in the forefront of pushing state-of-art and academic solutions for requirements engineering, testing and agile ways of working into the marketplace. The best paper will be selected from the submitted regular papers based on the reviews by the program committee.


Date and Time: March 13, 2017

Location: Waseda-University Nishiwaseda Campus, Tokyo, Japan, co-located with ICST 2017

09:00 - 09:10 Opening   (slides)
09:10 - 10:00 Keynote I: Challenges to Improve the Confidence in Cyber-Physical Systems   (slides)
Tetsuya Tohdo (Project Manager, Tokyo Office ePF Advanced R&D Dept., DENSO CORPORATION, Japan)
10:00 - 10:30 Coverage-Based Reduction of Test Execution Time: Lessons from a Very Large Industrial Project   (slides)
Thomas Bach, Artur Andrzejak and Ralf Pannemans
10:30 - 11:00   Coffee Break
11:00 - 11:30 Are CISQ Reliability Measures Practical? A Research Perspective   (slides) - BEST PAPER
Reinhold Plösch, Johannes Bräuer and Manuel Windhager
11:30 - 12:00 Impact of Education and Experience Level on the Effectiveness of Exploratory Testing: An
Industrial Case Study
Ceren Şahin Gebizli and Hasan Sözer
12:00 - 12:30 A Test Case Recommendation Method Based on Morphological Analysis, Clustering and
the Mahalanobis-Taguchi Method
Hirohisa Aman, Takashi Nakano, Hideto Ogasawara and Minoru Kawahara
12:30 - 14:00   Lunch Break
14:00 - 14:20 Results of a Comparative Study of Code Coverage Tools in Computer Vision   (slides)
Iulia Nica, Gerhard Jakob, Kathrin Juhart, and Franz Wotawa
14:20 - 14:40 Test Case Generation and Prioritization: A Process-mining Approach   (slides)
Andrea Janes
14:40 - 15:30 Keynote II: Software Testing in Industry and Academia: A View of Both Sides in Japan   (slides)
Satoshi Masuda (Senior Research Staff Member, Industries & Solutions, IBM Research - Tokyo, Japan)
15:30 - 16:00   Coffee Break
16:00 - 16:50 Open Session
  • Challenges and Experiences on the Adoption of Model-Based Methods and Model-Based Testing
    in Industry
    , Shaukat Ali and Tao Yue (Simula Research Laboratory, Norway)
  • Industry-Academia Collaboration, Hideto Ogasawara (Toshiba, Japan)
16:50 - 17:00 Best Paper Award & Closing


General Chair

Takashi Kitamura

Takashi Kitamura

Nat. Inst. of Advanced Industrial Science and Technology (AIST), Japan

Program Co-Chair

Emil Alegroth

Emil Al├ęgroth

Blekinge Institute of Technology (BTH), Sweden

Program Co-Chair

Rudolf Ramler

Rudolf Ramler

Software Competence Center Hagenberg (SCCH), Austria

Program Committee

  • Pekka Aho, VTT, Finland
  • Cyrille Artho, KTH Royal Institute of Technology, Sweden
  • Emelie Engström, Lund University, Sweden
  • Vladimir Entin, OMICRON electronics, Austria
  • Michael Felderer, University of Innsbruck, Austria
  • Elizabeta Fourneret, Smartesting, France
  • Vahid Garousi, Hacettepe University, Turkey
  • Maurizio Leotta, University of Genova, Italy
  • Zheng Li, Beijing University of Chemical Technology, China
  • Mika Mäntylä, University of Oulu, Finland
  • Bogdan Marculescu, Blekinge Institute of Technology, Sweden
  • Darko Marinov, University of Illinois at Urbana-Champaign, USA
  • Stefan Mohacsi, Atos, Austria
  • Shin Nakajima, National Institute of Informatics, Japan
  • Manuel Oriol, ABB Corporate Research, Switzerland
  • Reinhold Plösch, Johannes Kepler University Linz, Austria
  • Rakesh Rana, Lero - The Irish Software Research Centre, Ireland
  • Filippo Ricca, University of Genova, Italy
  • Ina Schieferdecker, Technische Universität Berlin, Germany
  • Hasan Sözer, Özyegin University, Turkey
  • Haruto Tanno, NTT, Japan
  • Guilherme Horta Travassos, Federal University of Rio de Janeiro, Brazil
  • Tatsuhiro Tsuchiya, Osaka University, Japan
  • Michael Unterkalmsteiner, Blekinge Institute of Technology, Sweden
  • Matthias Woehrle, Robert Bosch GmbH, Germany
  • Peter Zimmerer, Siemens Corporate Technology, Germany

Steering Committee

  • Michael Felderer, University of Innsbruck, Austria
  • Mark Harman, University College London, United Kingdom
  • Ina Schieferdecker, Technische Universität Berlin, Germany
  • Emelie Engström, Lund University, Sweden

Past Events

2016 | 2015 | 2014 | 2013 | 2012 | 2011 | 2010 | 2009 | 2008 | 2007 | 2006