Testing: Academic & Industrial Conference
Practice and Research Techniques



TAIC PART is a workshop that aims to forge collaboration between industry and academia on the challenging and exciting problem of real-world software testing. It is sponsored by representatives of both industry and academia, bringing together commercial and industrial software developers with academic researchers working on the theory and practice of software testing. The goals of TAIC PART range from the articulation of research questions in the field of software testing and analysis to practical challenges faced by software developers in industry. One aim is also to describe and discuss methods for better collaboration between academia and industry in these areas. TAIC PART is a unique event that strives to combine the important aspects of a software testing conference and workshop.

TAIC PART 2011 solicits papers within software testing, verification and validation of the following types:

  • Industry experience reports - provide practical and generalizable insights into how to apply and extend existing approaches to software testing and analysis
  • Research methods for collaborative research - describe ways that industry and academia can collaborate to further knowledge on testing, verification and validation
  • Industrial challenges with real-world testing - describe a real-world software testing problem for which industry seek help from industry or vice versa
  • Knowledge exchange between industry and academia - how can new results and knowledge be exchanged and transferred between the two partners

We invite submission of papers of the following types:

  • Short papers (6 pages): Experience reports, research methods, longer challenge papers
  • Fast Abstracts (2 pages): Work in progress, challenges

Authors should submit a PDF version of their paper through the TAIC PART 2011 paper submission site. Papers must be written in English and conform to the IEEE Format and Submission Guidelines. For details see the conference web site. All papers will undergo a rigorous review by at least three members of the program committee. All accepted papers will be part of the proceedings.

Short papers will be evaluated with respect to the real-world significance of the described testing experience as well as their ability to forge partnerships and ultimately yield successful solutions.

Fast Abstract papers are short papers that describes late breaking results, works in progress or real-world challenges and will be evaluated according to their ability to generate discussion and suggest interesting areas for future research.

Proceedings will be published in the IEEE Digital Library.




Sponsored by:

Co-located with: